Silicon Photonics Wafer-Level Testing — Accurately Reflecting Silicon Photonics Chip Performance
With the rapid development of AI, the transmission rates of data computing centers continue to rise, and traditional copper interconnects can no longer meet the needs of industrial products. Optoelectronic communication, with its advantages of high transmission rate and low loss, has become the mainstream choice in today's industry.
Silicon photonics leverages the mature CMOS process platform to generate, modulate, transmit and detect optical signals on a silicon substrate, offering inherent advantages of high bandwidth, low power and high integration. As 400G, 800G and even 1.6T optical modules enter commercial deployment, silicon photonics chips are moving from the lab to large-scale production, placing unprecedented demands on wafer-level testing.
Challenges & Solutions
Industry Pain Points
- In wafer-level testing, poor probe performance and significant calibration errors in the test system have a decisive impact on product performance and yield assessment.
- High insertion loss at high frequencies.
Our Advantages
- Probes designed for silicon photonics chips support signal testing from DC to 220 GHz.
- High-precision MEMS process design with excellent RF performance ensures consistent wafer-level testing.
- Low insertion loss design.
Our silicon photonics test solutions help customers precisely screen performance at the wafer stage and accelerate product iteration.
