Product Center
We provide high-performance RF and microwave test and measurement solutions, including probes, probe stations, calibration substrates, and couplers & diplexers.
Probes
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Waveguide Probe
Covers 70 GHz to 500 GHz with low insertion loss, ideal for millimeter-wave testing.
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Waveguide Differential Probe
Covers 110 GHz to 260 GHz with low insertion loss, ideal for millimeter-wave differential testing.
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Coaxial Probe
Ultra-broadband coaxial probe with high repeatability, ideal for chip-level testing.
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Coaxial Differential Probe
Ultra-broadband differential coaxial probe with high repeatability, ideal for chip-level differential testing.
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Dual-band Probes
Integrated dual-band design supports multi-band combined measurements, reducing probe changes and improving test efficiency.
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Probe System
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Manual Probe Station
Accommodates samples of various sizes, such as 8-inch and 12-inch wafers, and supports different applications, from DC to RF testing.
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Semi-Automatic Probe Station
Supports automatic XYZ-axis movement for multiple wafer sizes to achieve precise alignment, ideal for high-volume on-wafer DC and RF testing, improving test efficiency and consistency.
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Impedance Standard Substrates
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Impedance Standard Substrate
High-precision impedance standard substrates for calibrating probes and test systems.
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Couplers & Diplexers
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Directional Couplers
Unidirectional and bidirectional sampling designs with a 10 MHz main-line lower limit, covering up to 145 GHz, 12 dB typical coupling and 15 dB typical directivity.
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Diplexers
Combines a coaxial main line and a millimeter-wave extension path into a single test port; current products cover 10 MHz–170 GHz.
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