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Learn MoreGSSG Probes Fabricated with MEMS Process Design
Within the DC–175G/110-170G/140-220G/170-260 GHz bands, typical crosstalk reaches -25 to -30 dB, significantly outperforming the -10 to -15 dB achieved by international peers. Next-generation DC-220/250 GHz probes are under development, with simulated performance exceeding -25 dB.
A Unique and Advanced Calibration Method
At the software and algorithm level, combined with a special native differential on-wafer calibration method, the differential test reference plane is precisely calibrated to the probe tip, further correcting test-system errors caused by residual GS-SG crosstalk.
Company Profile
Accutera Probe is a probe brand spun out from academic institutions. Jinwei Optoelectronic Technology serves as the technical service and marketing company for Accutera Probe. Our products hold independent intellectual property rights and have earned recognition from industry leaders, they are supplied to numerous enterprises and research institutions globally, widely deployed in the semiconductor and communication sectors, with rapid repair and customized test solutions available.
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High-Performance Probes
High-performance RF probes covering DC to millimeter-wave bands for on-wafer S-parameter measurements, widely used in the semiconductor and communication industries.
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High-Performance Probe Systems
High-precision manual and semi-automatic probe stations for on-wafer device testing, flexibly configurable with various test environments and probe combinations.
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Equipped with comprehensive probe station test systems and offer a broad range of test services
Supports DC–67 GHz (GSG/GSSG), DC–110 GHz (GSG/GSSG), DC–170 GHz (GSG), 110–170 GHz (GSG) and 170–260 GHz (GSG) testing requirements.
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